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|注册
| 选择 | 型号 | 操作 | 更新时间 |
|---|---|---|---|
 CSP Hybrid Socket | 2023-01-04 | ||
| CSP Test Socket for Optical Laser Failure Analysis w/ Emission Microscopy | 2023-01-04 | ||
| CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy | 2023-01-04 | ||
| CSP/µBGA Test&Burn-In Socket for Devices Up to 6.5mm Square | 2023-01-04 | ||
| CSP/µBGA Test&Burn-In Socket for Devices up to 13mm Square | 2023-01-04 | ||
| CSP/µBGA Test&Burn-In Socket for Devices up to 55mm Square | 2023-01-04 | ||
| CSP/µBGA Test&Burn-in Socket for Devices from 14-27mm Square | 2023-07-05 | ||
| CSP/µBGA Test&Burn-in Socket for Devices up to 40mm Square | 2023-01-04 | ||
| CSP/µBGA Test&Burn-in Socket w/Adjustable Pressure Pad for Devices up to 27mm Square | 2023-07-05 | ||
| Correct-A-Chip® Socket with Collet Contacts | 2023-01-04 | ||
| CLE-123-01-G-DV-A-K | 2023-01-04 | ||
| CLE-124-01-G-DV-P | 2023-01-04 | ||
| CLE-153-01-G-DV-A-TR | 2023-01-04 | ||
| CLM-120-02-G-D-K | 2023-01-04 | ||
| CLM-120-02-L-D-BE | 2023-01-04 | ||
| CLM-120-02-LM-D-BE | 2023-01-04 | ||
| CLM-122-02-LM-D | 2023-01-04 | ||
| CLM-125-02-L-D-A-P-TR | 2023-01-04 | ||
| CLM-132-02-LM-D | 2023-01-04 | ||
| CLM-135-02-F-D-A-P-TR | 2023-01-04 |
